There are two Scanning Electron Microscopes at the Center for Advanced Microscopy, a JEOL 6400V (Japan Electron Optics Laboratories) with a LaB6 emitter (Noran EDS) and a JEOL 6300F with field emission (Oxford EDS). We offer the following services:
- Secondary Electron Imaging.
- Backscattered Electron Imaging
- Digital Imaging
- Analog Imaging
- Energy Dispersive X-ray Microanalysis (EDS)
For SEM services contact Stanley L. Flegler, 517-353-8798, flegler@msu.edu
Additional equipment available:
- Critical point dryer, Balzers CPD
- Gold spitter coater, (EMSCOPE SC500 Sputter coater, Ashford, Kent, Great Britain)
- Pure osmium coater (NEOC-AN, MEIWA SHOJI CO. LTD, JAPAN)
- Carbon string evaporator (EFFA MkII Carbon Coater , Ernest F. Fullam Inc., Latham, NY)