Atomic Force Microscopy (AFM)
There are two atomic force microscopes available through the Center for Advanced Microscopy, see below for details.
The Bruker MultiMode 8 offers imaging and nanomechanical testing.
Imaging modes
- Contact mode
- Tapping mode (soft)
- Tapping mode (standard)
- PeakForce Tapping
- ScanAssyst
Applications
- Nanoscale to ~3 micron scale sample topography
- Roughness measurements
- Force-distance curves and nanomechanical analysis
- Nanoscale magnetic and electrical testing (pending)
- Lateral / friction force measurements
- Fluid/wet sample measurements (pending)
Scanner
- E-scanner, 15 µm x-y limit
Specimen sizes
Specimens work best when they fit on a 15 mm disk, and should have less than 3 microns of topography in the regions of interest.
Bruker Dimension Icon AFM offers additional automation and capabilities in comparison with the MultiMode, in addition to larger areas of scanning.
Imaging modes
- Contact mode
- Tapping mode (soft)
- Tapping mode (standard)
- PeakForce Tapping
- ScanAssyst
Applications
- Nanoscale to ~3 micron scale sample topography
- Roughness measurements
- Force-distance curves and nanomechanical analysis
- Nanoscale magnetic and electrical testing (pending)
- Lateral / friction force measurements
- Fluid/wet sample measurements (pending)
Scanner
- Icon: 90 x 90 µm typical x-y, 9.5 µm Z
- Dimension FastScan: 34 x 34 typical x-y, 3 µm Z
Specimen sizes
The Dimension system is more flexible to allowing a range of sample sizes compared with the MultiMode. The system includes a 210 mm vacuum chuck for samples < 210 mm in diameter and <15 mm thick.
For AFM services or training contact Andy Elwood Madden (maddenan@msu.edu). For data analysis, we recommend downloading Gwyddion.