Image of gold nanoparticles collected on the JEOL 2200FS
Transmission Electron Microscopy (TEM)
The primary transmission electron microscope for biological sciences. There is no X-ray detector installed, but EDS can be performed on TEM grids using either the 2200FS TEM or the 7500F SEM.
Electron gun
- 100 kV (120 kV max)
- LaB6 emitter
- High-tilt holder
- Four-position holder
- tilt range +/- 70 degrees
- lattice resolution 0.2 nm
- high contrast pole piece
- Matataki Flash sCMOS, up to 30 fps
- Bright field or dark field imaging
- Selected area electron diffraction (SAED)
- Automated stitching/ montaging (Limitless Panorama)
- Optical Microscope Correlation function in which an image from an optical microscope can be imported and overlaid on a TEM image to facilitate correlative microscopy.
The primary transmission electron microscope for the physical sciences at the Center for Advanced Microscopy (CAM).
Electron gun
- 200 kV
- Thermal field emitter (Schottky)
- Single-tilt holder
- Double-tilt holder
- Analytical holder
- Gatan cryo-holder
- high tilt pole piece currently installed, UHR pole piece available
- Gata Rio CMOS camera with Digital Micrograph
- Oxford X-ray detector / Inca
- DE-20 direct electron camera (installed but not currently connected)
- JEOL and Gatan ABF, ADF, and HAADF STEM detectors (not currently connected)
- Bright field or dark field imaging
- Selected area electron diffraction (SAED)
- Covergent beam / nanobeam diffraction
- Energy dispersive X-ray analysis (EDS)
- Energy filtered imaging and electron loss spectroscopy (currently down)
- STEM mode imaging (ABF, ADF, HAADF - currently down)
- Cryo-TEM imaging
- Electron tomography and low-dose imaging with SerialEM (currently down)
The JEOL 2200FS high resolution transmission electron microscope at the MSU Center
for Advanced Microscopy, with Dr. Xudong Fan.
Images taken on the JEOL 2200FS transmission electron microscope. (a) TEM image of
a Mg-doped boron nano-wire. (b) Z-contrast STEM image showing Mg-doping site. (c)
Diffraction pattern
For physical science TEM services contact Andy Elwood Madden, maddenan@msu.edu.
Enrollment in NSC-815 or NSC-816 TEM labs these labs is temporarily suspended). Please contact Andy Elwood Madden, maddenan@msu.edu. for more information.
The JEOL 2200FS 200 kV field emission TEM for physical sciences was funded by a National Science Foundation Major Research Instrumentation grant.
See our 'How to prepare samples' page for protocols, our sample preparation instrument page for related available resources, and our services page for more descriptions of available services.
For biological TEM services contact Dr. Alicia Withrow, 517-355-5004, pastorle@msu.edu.
For enrollment in NSC-810 Biological TEM Lab, contact Dr. Alicia Withrow, 517-355-5004, pastorle@msu.edu. This is a limited enrollment course with specific enrollment procedures. Please see our Courses page for more information.
See our 'How to prepare samples' page for protocols, our sample preparation instrument page for related available resources, and our services page for more descriptions of available services. For assitance with the 2200FS TEM, contact Dr. Andy Elwood Madden, maddenan@msu.edu.