New SEM training options

Oct 1, 2026 |

Abby Vanderberg working with a student on the SEM

As of this October, there are now three ways to access the SEMs in the MSU Center for Advanced Microscopy:

Assisted use: our team can help you with sample preparation and operation of the equipment to collect your data.
Enrollment in the NSC 820 course: you can learn theory and practice of SEM use during the semester-long course and become an independent user of the microscope(s).
Starting Oct. 2026 and available afterwards - individualized training that can be initiated whenever the student/researcher has samples ready.

Please note that it doesn't make sense to start training until you're ready to start using the SEM somewhat regularly. We'll need to re-train if you don't use / practice for a long time after the initial session(s). The assisted route is available if you have urgent or sporadic research needs. If you have research samples ready for SEM imaging +/- elemental X-ray analysis, just email and let us know if you'd like to start with assisted use or training. We're happy to discuss additional details of the process with you.

We're excited about our new X-ray analysis capabilities this fall to share with you, including much faster collection of spectra and maps, large area montaging for automated collection of high-resolution x-ray maps over large areas, live chemical imaging, and better reporting/ data export options.

NSC 820 course versus SEM training
Topic	Training	NSC 820 course
Cost	~$400 for instrument and staff time using our posted hourly rates, higher for advanced techniques	$400 in ‘pre-billed’ funds that can all be used for research during/ after course enrollment semester
Hrs of hands-on instruction	~7	~17
Lectures/ theory	Reference material and website references	~40 hours of classroom instruction and activities
Scope	Basic sample preparation and instrument operation for trainee’s current samples. Other modules optional, billed at the assisted rate.	Conceptual, theoretical, and practical fundamentals of SEM instrumentation, signal generation and detection, electron sources, resolution, depth of field, changes in accelerating voltage, qualitative and quantitative X-ray analysis , EDS hardware, sample preparation and sample coating, variable pressure, dual-beam FIB-SEM, metadata and data presentation; complementary digital optical microscopy.
Availability	May be started anytime the trainee has research samples ready; subject to staff and instrument availability	Course runs every fall and spring semester. Typically fills up before the start of the semester so reach out early for a spot.
Peer interaction	None	Weekly interactions with students from many departments
Outcomes	Following successful checkout, Independent basic operation using one SEM ; readiness for more optional advanced training	Ready to independently use or check out on standard and hi-res SEMs and digital optical microscope; ability to design and carry out SEM experiments on new types of samples; ability to optimize imaging and analysis with a toolbox of strategies; prepared for careers involving electron microscopy and microanalysis.