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AFM capabilities now available through the CAM

TAtomic force microscopy image in 3D of a calibration grid with square trencheshe CAM is now supporting users on two Atomic Force Microscope systems for air-based imaging and analysis measurements: a Bruker Dimension Icon system and a Bruker MultiMode 8 system.  In the weeks ahead, we'll be working on adding fluid-cell based data collection.  The systems are also capable of a variety of other types of measurements that can be explored.  Reach out to Andy with any questions (maddenan@msu.edu).
 
 
 
AFM data from calibration grid with 1 micron pitch spacing collected on the MultiMode 8 system.